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SIeve+ 2018 - New - List Price

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Price:
$760.00
SKU:
SWS418N-l

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Product Description


Also see - PDF-4+ - PDF-4+/Minerals - PDF-4+/Organics - WebPDF-4+ -- PDF-2

PDF-2 Technical Bulletin
PDF-4+ Technical Bulletin
PDF-4/Organics Technical Bulletin

SIeve/SIeve+ Technical Bulletin
Electron Diffraction Technical Bulletin
Thermal Expansion Technical Bulletin
Nanomaterials Technical Bulletin
Time-of-Flight Technical Bulletin
Synchrotron and Neutron Data Analysis User’s Guide

PDF Product Summary Flyer 
PDF Product Booklet   
PDF - Which Database? Flyer
PDF-2 Ten Years Later
WebPDF-4+ Flyer
PDF-4+ Scholar Flyer
Electron Diffraction Flyer
PDF-2/PDF-4 Data Mining

PDF-2/PDF-4 Display Capabilities

SIeve 2018 (included for FREE in PDF-2)

SIeve+ 2018

Search and Identify

ICDD’s search indexing programs, SIeve for PDF-2 and SIeve+ for PDF-4, are designed to search and identify unknown materials. SIeve and SIeve+ are integrated into the ICDD databases to allow the use of the extensive data mining interfaces, searches, and sorts available to improve accuracy and precision of the identification process. For example, users can utilize the extensive permutable searches in each database, then define their own search subfile or use any of the “application or expert-defined” subfiles and subclasses to increase the accuracy of their phase identification. In many cases, this provides a unique capability to analyze the most difficult problems.

SIeve and SIeve+ offer a variety of algorithms and options that allow users to optimize results for particular chemistries and both standard and non-standard diffraction systems. SIeve and SIeve+ feature automatic rotation of the eight strongest lines (Hanawalt) or the eight longest of the strongest lines (Fink) or the eight longest lines (Long8) to look for entries that exhibit the best Goodness of Match (GOM). In the last few years, new algorithms have been added to identify non-crystalline materials and complex multi-phase specimens. Most of the algorithms were developed and optimized for a particular type of analysis and the options provide the user with a wide breadth of analytical capability. SIeve/SIeve+ can be complementary with most commercial software programs. This complementary nature demonstrates the strength of SIeve/SIeve+ in the analysis of minor and trace phases where the full filtering capability of the PDF-2 and PDF-4 databases can be applied.

Try SIeve+ for a free 30-day trial after you install your database and discover its phase identification capability. At the end of the 30-day trial period, contact ICDD or your vendor for a license. Please note: ICDD's search-indexing software is included in PDF-2 (SIeve) and PDF-4/Organics (SIeve+) free of charge.

 

  

Importing Wavelength Specific Diffraction Data

For accurate diffraction simulations, users can choose instrument parameters from synchrotron and neutron beamlines (FullProf, GSAS, GSAS-II file formats) when importing experimental data. There is an option for user-defined Kα1/Kα2 for removing the Kα2 profile. In cases where an instrument has a known 2θ zero error, a user correction can be specified.

 

 

Pricing is available for multiyear & site licenses. Please contact the ICDD's Customer Service Department for further information.


PLEASE NOTE: Customers in Japan, Korea and Russia must order ICDD products through an ICDD licensed distributor. This does not apply to ICDD clinics, conferences or workshops.

PLEASE NOTE: It is very important that the billing address associated with your account matches the address of the credit card holder. A mismatched address will result in the transaction being declined.

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